myscope.training

• charset: utf-8
• name: viewport content: width=device-width, initial-scale=1
• name: robots content: index, follow
• name: keywords content: keywords
• property: og:title content: Check out MyScope™ online microscopy training tool.
• property: og:type content: website
• property: og:url content: https://myscope.training/
• property: og:image itemprop: image primaryImageOfPage content: https://myscope.training/images/myscope.jpg
• property: og:image:secure_url content: myscope.training/images/myscope.jpg
• property: og:image:type content: image/jpeg
• property: og:image:width content: 400
• property: og:image:height content: 210
• property: og:description content: MyScope™ is a wonderful online tool for professional training in microscopy and microanalysis. It has theoretical and practical information, very realistic simulators, and assessments.
• name: twitter:card content: summary_large_image
• name: twitter:site content: @GoInnerSpace
• name: twitter:title content: Check out MyScope™
• name: twitter:description content: Fantastic online microscopy training with realistic simulators.
• name: twitter:image content: https://myscope.training/images/myscope.jpg
• name: description content: MyScope™ is a fantastic online training tool for microscopy and microanalysis. It’s got loads of relevant information, very realistic simulators and assessments. It really helps teach you how to use the instruments.

• Train for advanced research
• http://myscope.training/
• What is Microscopy?
• Magnification
• Magnification and measurement
• Resolution
• Depth of field
• Introduction to the Electromagnetic Spectrum
• Wavelength, frequency and energy
• Electromagnetic spectrum and microscopy
• Interactions with Matter
• Lenses
• Types of aberration
• Overcoming aberrations
• Calibrations
• Nyquist Sampling
• Detectors and Cameras
• Introducing digital images
• Images for Print in Journals and Posters
• Images for Presentation
• Colour enhancement
• Image Ethics
• Credits
• SEM Basics
• Applications and uses of SEM
• What can it do differently to a light microscope?
• What can’t it do?
• Structure of an SEM
• How the gun works
• Electron sources
• Filament saturation
• Vacuum system overview
• Types of pumps
• Vacuum requirements
• Water chilling system
• Structure of the column
• The specimen chamber
• Beam/specimen interactions
• The image
• A basic guide to using an SEM
• Specimen preparation
• Accelerating voltage
• Apertures
• Spot size
• Working distance
• Contrast and brightness
• Magnification and calibration
• Scan rate and signal to noise
• Image artefacts and trouble-shooting
• CL
• ESEM
• Cryo-SEM - Cold stage
• FIB
• EDS
• EBSD
• EBL
• Backscatter
• Credits
• Introduction to TEM
• Key advantages
• What the TEM can do
• What the TEM can't do
• Instrument design
• Resolution
• Introducing TEM components
• Vacuum system
• Electron gun
• Electron column
• Electromagnetic lenses
• Specimen/sample chamber
• Image capture
• Detectors
• Image formation basics
• Bright-field images
• Dark-field images
• Diffraction
• Getting started with instrument alignment
• Condenser lens centre
• Condenser lens stigmation
• The eucentric position
• Focus
• Use of objective appertures
• Final adjustment
• Types of problems
• Spherical aberration
• Chromatic aberration
• Astigmatism
• Understanding instrument settings
• Introduction to specimen preparation
• Specimen holders
• Getting started with organic samples
• Ultramicrotomy
• Immunolabelling
• Staining
• Cryo-fixation
• Chemical fixation
• Dehydration
• Infiltration
• Polymerisation
• Grid mounting
• Negative staining
• Cryo-substitution
• Low temperature polymerisation
• Freezing methods
• Cryo-ultramicrotomy
• Cryo-transfer
• Freeze-etch
• Replica
• Sample prep flow chart
• Powders
• Preparing from the bulk
• Dimpling
• Mechanical polishing
• Electro-polishing
• Ion beam thinning
• Focussed ion beam milling
• Artifacts
• Introduction to Cryo
• Why Cryo TEM?
• The freezing process
• Introduction to diffraction
• Image appearance
• The diffracted beam
• Tilting
• Camera length
• Kikuchi patterns
• Selected area diffraction (SAD)
• Ring patterns
• Convergent beam electron diffraction (CBED)
• Dark-field imaging
• What is high resolution imaging?
• Bright field STEM
• Beam–sample interactions
• Use of ronchigrams in STEM
• STEM detectors
• High-angle-annular dark-field (HAADF)
• Introduction to EDS
• Quantification of EDS data
• Electron energy loss spectroscopy (EELS)
• Credits
• Basics
• What makes an objective good?
• Aberrations
• The complete microscope
• Koehler illumination
• The light path and microscope
• Performing Koehler illumination
• What is Brightfield imaging?
• Microscope components for transmitted light imaging
• Light Path for BF microscopy
• The five techniques
• Bright field
• Dark field microscopy
• Phase contrast
• Differential interference contrast imaging (DIC or Nomarski imaging)
• Polarised light microscopy
• Reflected light imaging
• What is Fluorescence imaging?
• The light path and microscope parts
• What is Confocal imaging?
• A practical confocal microscope
• Laser
• Filters
• Photomultiplier tubes (PMTs)
• Adjustments
• The eternal triangle
• What is important?
• The Confocal Pinhole
• How scanning works
• Scan areas and relationship to pixels and resolution
• Zoom
• Laser power
• Adjusting the Image and Detector Controls
• Averaging
• Using multiple dyes
• Fluorescence Spectra
• Fluorescence Spectral Overlap
• Simultaneous Imaging
• Sequential Imaging
• What is a Z-stack?
• Optical Section Thickness
• Nyquist Sampling for Z stacks
• Under and Over Sampling in Z Stacks
• Projections
• Image rotations
• Axial resolution and Optical section thickness
• The power of Super-Resolution
• Criteria for optical resolution
• Advantages of higher resolved images
• Overview to STED/RESOLFT
• Introduction to STED
• The Photo-physical Principle
• Resolution in STED microscopy
• RESOLFT
• One point at a time
• PALM
• dSTORM / GSDIM
• STORM
• PAINT and DNA PAINT
• 3D-SMLM
• Sample preparation
• Sample fixation
• Properties of labels
• Live-cell Imaging
• Labeling via affinity probes
• Fluorophores and strategies for fixed samples
• Live-cell STED Imaging
• Fluorophores and their properties
• The optical path of a STED microscope
• STED Imaging
• The optical path of a SMLM microscope
• Blinking fluorophores
• Buffer
• UV Light
• Exposure time
• Image reconstruction from SMLM data
• Credits
• Introduction to cryo techniques
• Why cryo?
• Which cryo technique to use
• Challenges of cryo
• Properties of water
• Freezing of water
• Plunge freezing
• High pressure freezing
• Other freezing techniques
• Introducing cryo-TEM
• The microscope
• Electron energy filters
• Phase plates
• Electron detectors
• How images are formed
• Why do Fourier transforms
• What is a Fourier Transform?
• Fourier transforms in cryo-TEM image processing
• The power spectrum
• Why do we even need to look at the power spectrum?
• Contrast transfer function
• Introducing Single Particle Analysis
• Biochemical preparation and stabilisation
• Specimen screening by negative staining
• Vitrification
• Optimisation of orientation and distribution
• Specimen screening by cryo
• Data acquisition
• Motion correction
• Dose weighting
• Averaging
• Particle picking
• 2D classification
• 3D reconstruction
• Validation
• Sub-tomogram averaging
• Introducing cryo-electron tomography
• The TEM for cryo-ET
• Sample preparation
• Tomogram reconstruction
• Tomogram interpretation
• Introducing sub-tomogram averaging
• Sub-tomogram averaging and alignment
• Sub-tomogram classification
• Model refinement and validation
• Diffraction-based Cryo-EM Techniques
• 2D crystallography
• Introducing Micro-ED
• The sample for Micro-ED
• Sample preparation for Micro-ED
• The TEM for Micro-ED
• Sample screening for Micro-ED
• Data collection – Micro-ED
• Data analysis – Micro-ED
• Introducing cryo-SEM
• Cryo-SEM design
• Sample preparation – Freezing & cryo-transfer
• Sample preparation – Fracturing and cryo-planing
• Sample preparation – Sublimation
• Sample preparation – Coating
• Cryo-SEM operation
• Cryo-SEM microanalysis
• Cryo-SEM artefacts
• Introducing cryo-FIB
• TEM lamella production by cryo-FIB
• Cryo-FIB-SEM Volume Imaging
• Cryo-ultramicrotomy
• Credits
• XRD basics
• Interesting facts
• Nobel prizes for research with X-rays
• X-rays Overview
• Properties of X-rays
• Production of X-rays
• Crystal structure
• Miller Indices
• Wave structure
• Interaction of X-rays with matter
• Diffraction of X-rays by a crystal
• Penetration depth
• Diffraction measurements
• Anatomy of an X-ray diffractometer - Intro
• Source
• Primary optics
• Sample holder & stage
• Secondary optics
• Types of samples
• What is good data?
• The importance of specimen height
• Safety
• What the data tells you
• Phase identification
• Quantitative analysis
• Factors affecting peak intensity - Intro
• Structure Factor
• Multiplicity factor
• Lorentz polarisation factors
• Temperature Factor
• Summation of factors effecting peak intensity
• Factors effecting peak width
• What is Rietveld refinement?
• Summary of analysis cues
• What is texture?
• Displaying texture
• Measuring texture with X-rays
• Normalisations
• Residual stress
• Glancing Angle XRD
• Glancing angle XRD
• Credits
• Welcome
• What is microanalysis?
• What is energy dispersive spectroscopy?
• Outputs from EDS analysis
• Generation of X-rays in the electron microscope
• Bremsstrahlung X-ray generation
• Kramer's law
• Characteristic X-rays
• Characteristic X-ray generation
• Nomenclature
• The X-ray spectrum
• Moseley's law
• Intensity basics
• Fluorescence yield
• X-ray absorption
• X-ray detection by EDS
• The detector
• The pulse processor
• The multi-channel analyser or display
• Care and calibration
• EDS spectral resolution
• EDS spectral artefacts
• Qualitative EDS X-ray microanalysis using SEM and TEM
• X-ray peak identification
• Quantitative EDS - overview
• Limitations of quantitative analysis
• Standardized quantitative analysis
• Spectral processing
• Concentration calculation
• Accuracy, precision and detection limits
• Random and systematic errors
• Mapping information
• Parameters for X-ray mapping
• Artefacts in X-ray mapping
• Credits
• Overview
• Applications of APT
• What can APT do differently?
• What can't APT do?
• A brief history of APT
• The principle of APT
• Two flight path options
• Position of atoms within the sample
• Atomic position in the sample
• Chemical identification
• 3D data visualisation
• Laser-assisted APT
• Spatial resolution of APT
• Mass resolution of APT
• The vacuum system
• Handling and transferring samples
• The local electrode
• Ion detection
• The voltage control system
• The Laser system
• The cryogenic system
• The control system
• Specimen requirements
• Two main techniques
• Electropolishing
• Focused Ion Beam (FIB)
• Mounting the sample
• Inserting the sample in the atom probe
• Specimen coarse alignment
• Collecting data
• Data quality
• Experimental parameters
• Voltage mode acquisition
• Laser mode acquisition
• End of data acquisition
• Data processing steps
• Selection of ion sequence range
• Selection of region of interest (ROI)
• Time of flight corrections
• Mass calibration
• Ranged-ion assignment
• Reconstruction
• Key reconstruction parameters
• Mass spectral analysis
• Grid voxelisation
• Interfaces
• Proxigram analysis
• Solute analysis / Clustering
• Spatial distribution maps
• Field Ion Microscopy
• Correlative SEM / APT
• Cryogenic transfer capabilities
• Credits
• FIB overview
• Common applications of FIB
• Ion sources
• Introduction to ion solid interactions
• How many ions?
• Interaction Overview
• Dislocation/Displacements
• Ion Implantation
• Secondary Electrons
• Secondary Ions, Backscattered Ions and Phonons
• Energy loss
• Collision Cascade
• Sputtering Overview
• Sputtering Yield
• Overview
• Introduction to components
• Vacuum system and Chamber
• SEM and FIB columns
• Imaging and Analytical Detectors
• Sample Stage
• Gas Injectors
• Manipulators
• Geometry
• Beam Geometry
• Imaging Artefacts
• Eucentric Height
• Coincidence Point
• Image Formation
• Charging
• Channeling Contrast
• Destructive Imaging
• Patterning Mechanism
• Patterning Parameters
• Acceleration Voltage
• Aperture/Beam current
• Passes/Dwell time
• Overlap/Pitch
• Scan Direction
• Beam Alignments
• Introduction to Artefacts
• Curtaining
• Redeposition
• Implantation
• Phase Transformations
• Amorphization
• Interface Mixing
• Heat damage
• Channeling
• Deposition
• Introduction to cross-sectioning
• Tips and Tricks
• Intro to TEM-lamella preparation
• Deposition of protective layer
• Prepare Lamella via cross-sectioning
• J-cut
• Lift-out
• Thinning
• Polishing
• 3D Tomography
• Credits
• Introduction
• Background information
• Imaging: Interactions
• What can you measure?
• Intro
• Contact mode
• Tapping mode
• Non-contact mode
• Specimen choice
• Contact and tapping modes
• Data display
• Image artefacts
• Tip artefacts
• Scanner artefacts
• Laser alignment on cantilever
• Cantilever tuning
• Scan rate
• Gains
• Feedback
• Control modes
• Discontinuous
• Proportional control (P)
• Integral control
• Derivative control
• Composite control (PID)
• Scanning Tunneling Microscopy (STM)
• Near-field scanning optical microscope (NSOM/SNOM)
• Tip enhanced Raman spectroscopy (TERS)
• Credits
• What is SIMS?
• Mass analysers in SIMS
• Applications of SIMS
• Ion–Sample Interactions
• Static vs dynamic SIMS
• Liquid-Metal Ion Guns
• Cluster Sources
• Pulsing
• Bunching
• Time of Flight analysers – overview
• Inside the ToF analyser
• Reflectron-TOF
• ESA TOF
• Detectors
• Data
• Sample requirements for ToF-SIMS
• Powders
• Suspensions and solutions
• Typical applications
• Pharmaceutical science
• Geology and mineralogy
• Forensics
• Common features of the Large Geometry and NanoSIMS
• Primary Ions and Primary column
• Sample chamber and stage
• Dynamic mode
• Secondary column
• Double focussing mass spectrometer - overview
• Electrostatic analyser
• Magnetic sector analyser
• Magnetic sector analyser operation
• Sample preparation for LG and Nano-SIMS
• Benefits of LG-SIMS
• Data Output from LG-SIMS
• Instrument performance
• Calibration
• Matrix effect
• LG-SIMS for isotope geochemistry
• Applications of LG-SIMS in geoscience
• LG-SIMS for Nuclear Safeguards and Forensics
• Benefits of Nano-SIMS
• NanoSIMS applications
• NanoSIMS – Cancer therapeutics
• NanoSIMS – Environmental processes
• NanoSIMS – Medical
• NanoSIMS – Geology
• NanoSIMS – Materials Science
• Credits
• What is research data?
• Introduction to research data management
• Maintaining quality and integrity
• Benefits of managing research data
• What is FAIR data?
• The FAIR principles explained
• Persistent identifiers
• Are FAIR data and open data the same?
• What are CARE principles?
• What are Indigenous data?
• The CARE principles explained
• FAIR and CARE are complementary
• Global guidelines
• Research data management plans
• Credits
• Introduction
• Typical hazards at a microscopy facility
• Your specimen
• Microscopy specimen preparation
• Microscope operation
• Local rules
• Supporting documentation
• Summary
• Credits
• Microscopy Concepts
• Scanning Electron Microscopy
• Transmission Electron Microscopy
• Light & Fluorescence Microscopy
• Cryo-Electron Microscopy
• X-ray Diffraction
• Energy Dispersive Spectroscopy
• Atom Probe Tomography
• Focused Ion Beam
• Scanning Probe & Atomic Force Microscopy
• Secondary Ion Mass Spectrometry
• Research Data Management
• Work Health and Safety
• SEM Simulator
• TEM Simulator
• LFM Simulator
• XRD Simulator
• EDS Simulator
• APT Simulator
• FIB Simulator
• SPM Simulator
• https://www.facebook.com/sharer/sharer.php?u=https%3A%2F%2Fmyscope.training%2F&src=sdkpreparse
• Twitter
• https://twitter.com/intent/tweet?url=https%3A%2F%2Fmyscope.training%2F
• https://www.linkedin.com/shareArticle?mini=true&url=https://myscope.training&title=MyScope%20-%20Training%20for%20advanced%20research&summary=MyScope%20is%20a%20wonderful%20online%20tool%20for%20professional%20training%20in%20microscopy%20and%20microanalysis.%20It%20has%20theoretical%20and%20practical%20information,%20very%20realistic%20simulators,%20and%20assessments.&source=myscope.training
• Publications on MyScope

• Microscopy Australia
• http://sydney.edu.au/acmm/
• https://cmm.centre.uq.edu.au/
• http://www.analytical.unsw.edu.au/facilities/emu
• http://microscopy.anu.edu.au/
• http://www.cmca.uwa.edu.au/
• https://www.flinders.edu.au/microscopy/
• http://www.adelaide.edu.au/microscopy/
• https://fii.unisa.edu.au/
• https://www.monash.edu/researchinfrastructure/mcem
• https://www.fei.com/home/
• https://www.cameca.com/
• https://www.globalbioimaging.org
• http://www.ntu.edu.sg/Pages/home.aspx
• http://www.leica-microsystems.com/science-lab/
• http://myscope-explore.org.au/
• http://creativecommons.org/licenses/by-sa/4.0/
• The University of Sydney
• The University of Queensland
• Australian National University
• The University of Western Australia
• The University of Adelaide
• University of South Australia
• CAMECA
• Nanyang Technological University
• Leica
• https://www.youtube.com/microscopyaustralia
• Microscopy Australia
• MyScope Explore
• Technique Finder
• please see our access guide
• Instagram
• Twitter
• Linkedin

            Domain Name: MYSCOPE.TRAINING
Registrar: Key-Systems, LLC
Domain Status: client delete prohibited
Domain Status: client transfer prohibited
Domain Status: client update prohibited
Registry Expiry Date: 2028-03-30T01:47:03.493Z
Creation Date: 2017-03-30T01:47:03.493Z
Updated Date: 2026-08-12T11:24:21.463Z
Name Server: METRO.UCC.USYD.EDU.AU
Name Server: EXTRO.UCC.USYD.EDU.AU
Name Server: DNS-1.SYDNEY.EDU.AU
Name Server: DNS-2.SYDNEY.EDU.AU
REGISTRAR Contact: Key-Systems, LLC
>>> Last update of RDAP database: 2026-08-13T15:25:04Z         

			User-agent: *
Disallow:

Sitemap: https://myscope.training/sitemap.txt        

Référencement technique

Référencement sur la page

Contenu et UX